Title :
Background adaptive cancellation of digital switching noise in pipelined ADCs without noise sensors
Author :
Chang, N.C.-J. ; Hurst, P.J. ; Levy, B.C. ; Lewis, S.H.
Author_Institution :
Marvell Semicond., Inc., Santa Clara, CA, USA
Abstract :
Switching noise cancellation (SNC) at the output of a pipelined ADC without noise sensors is proposed to reduce both additive and multiplicative noise errors stemming from digital switching noise coupling to analog circuits. A prototype 12b 40MS/s ADC was fabricated in 0.18-μm CMOS. The ADC plus digital test circuits occupy 4 mm2. With periodic switching noise, SNC improves SNDR by 10 dB and SFDR by 26 dB. With random switching noise, SNC improves SNDR by 13 dB and SFDR by 9 dB. In both cases, SNC nearly cancels all the switching noise errors.
Keywords :
CMOS integrated circuits; analogue-digital conversion; integrated circuit noise; integrated circuit testing; random noise; CMOS; SFDR; SNC; SNDR; additive noise error; analog circuit; background adaptive cancellation; bit rate 40 Mbit/s; digital switching noise coupling; digital test circuit; multiplicative noise error; noise sensor; periodic switching noise; pipelined ADC; random switching noise; size 0.18 mum; switching noise cancellation; switching noise error; Additives; Noise; Prototypes; Substrates; Switches; Switching circuits; System-on-a-chip;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330667
