DocumentCode
1806785
Title
Ion chromatography analysis of fluorine contamination in wafer packaging materials
Author
Younan, Hua ; Redkar, Shailesh ; Chi-Kwan, Lau ; Jianhua, Lin
Author_Institution
Chartered Semicond. Manuf. Ltd, Singapore, Singapore
fYear
2002
fDate
19-21 Dec. 2002
Firstpage
182
Lastpage
184
Abstract
So far, it is difficult to determine quantitatively very lower level fluorine in packaging materials in wafer fabrication. In this paper, we will introduce a rapid determination technique, Ion Chromatography, to determine trace of fluorine in packaging foam materials. Using this method, the concentration of fluorine in packaging foam materials can be quantitatively determined very lower level (<4 ng/cm2). The advantages of this method are fast, accurate and repeatable of the results obtained. In this paper, we will introduce this determination method and discuss the details of sample preparation, determination conditions and results.
Keywords
chromatography; contamination; fluorine; foams; integrated circuit packaging; F; fluorine contamination; ion chromatography; packaging foam materials; sample preparation; wafer fabrication; wafer packaging materials; Assembly; Cleaning; Contamination; Filters; Materials testing; Monitoring; Optical device fabrication; Semiconductor device packaging; Semiconductor materials; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
Print_ISBN
0-7803-7578-5
Type
conf
DOI
10.1109/SMELEC.2002.1217801
Filename
1217801
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