• DocumentCode
    1806785
  • Title

    Ion chromatography analysis of fluorine contamination in wafer packaging materials

  • Author

    Younan, Hua ; Redkar, Shailesh ; Chi-Kwan, Lau ; Jianhua, Lin

  • Author_Institution
    Chartered Semicond. Manuf. Ltd, Singapore, Singapore
  • fYear
    2002
  • fDate
    19-21 Dec. 2002
  • Firstpage
    182
  • Lastpage
    184
  • Abstract
    So far, it is difficult to determine quantitatively very lower level fluorine in packaging materials in wafer fabrication. In this paper, we will introduce a rapid determination technique, Ion Chromatography, to determine trace of fluorine in packaging foam materials. Using this method, the concentration of fluorine in packaging foam materials can be quantitatively determined very lower level (<4 ng/cm2). The advantages of this method are fast, accurate and repeatable of the results obtained. In this paper, we will introduce this determination method and discuss the details of sample preparation, determination conditions and results.
  • Keywords
    chromatography; contamination; fluorine; foams; integrated circuit packaging; F; fluorine contamination; ion chromatography; packaging foam materials; sample preparation; wafer fabrication; wafer packaging materials; Assembly; Cleaning; Contamination; Filters; Materials testing; Monitoring; Optical device fabrication; Semiconductor device packaging; Semiconductor materials; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
  • Print_ISBN
    0-7803-7578-5
  • Type

    conf

  • DOI
    10.1109/SMELEC.2002.1217801
  • Filename
    1217801