Title :
Noise analysis of correlated double sampling SC-integrators
Author_Institution :
Motorola Labs., Schaumburg, IL, USA
Abstract :
A noise analysis of SC-integrators employing correlated double sampling is presented. Approximate expressions describing the effect of correlated double sampling on the amplifier noise are derived. It is shown that the parasitic capacitance at the amplifier input mainly determines the attenuation of the low-frequency noise.
Keywords :
CMOS analogue integrated circuits; amplifiers; flicker noise; integrated circuit noise; integrating circuits; switched capacitor filters; thermal noise; white noise; CMOS amplifiers; amplifier noise; amplifier white noise; approximate expressions; correlated double sampling SC-integrators; flicker noise; low-frequency noise attenuation; noise analysis; parasitic capacitance; thermal noise; 1f noise; Circuit noise; Clocks; Delay; Frequency domain analysis; Low-frequency noise; Low-noise amplifiers; Operational amplifiers; Phase noise; Sampling methods;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010488
