Title :
A 5-Gbps 1.7 pJ/bit ditherless CDR with optimal phase interval detection
Author :
Park, Myeong-Jae ; Kim, Hanseok ; Son, Seuk ; Kim, Jaeha
Author_Institution :
Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., Seoul, South Korea
Abstract :
Dithering in bang-bang controlled CDRs poses conflicting requirements on the phase adjustment resolution as one tries to maximize the tracking bandwidth and minimize jitter. A novel phase interval detector that looks for a phase interval enclosing the desired lock point is shown to find the optimal phase that minimizes the timing error without dithering. A digitally-controlled, phase-interpolating DLL-based CDR fabricated in 65nm CMOS demonstrates that it can achieve low jitter of 41-mUIp-p with a coarse phase adjustment step of 0.11-UI, while dissipating only 8.4mW at 5Gbps. In addition, a digitally-controlled in-situ measurement circuit that can characterize the CDR´s jitter tolerance is presented.
Keywords :
CMOS integrated circuits; clock and data recovery circuits; jitter; phase detectors; CMOS; bang-bang controlled CDR; bit rate 5 Gbit/s; clock-and-data recovery; digitally-controlled DLL-based CDR; digitally-controlled in-situ measurement circuit; ditherless CDR; jitter minimization; jitter tolerance; optimal phase interval detection; phase adjustment resolution; phase-interpolating DLL-based CDR; power 8.4 mW; size 65 nm; tracking bandwidth maximization; CMOS integrated circuits; Clocks; Detectors; Jitter; Phase locked loops; Prototypes; Timing;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330683