Title :
Research on Intrinsic Safety Behavior of Inductor-Disconnected-Discharge of Boost DC-DC Converters
Author :
Shulin, Liu ; Yan, Li
Author_Institution :
Sch. of Electr. & Control Eng., Xi´´an Univ. of Sci. & Technol., Xi´´an, China
Abstract :
Inductor-disconnected-discharge (IDD) behavior of the boost converter is analyzed, an equivalent-resistance-analysis method (ERAM) is proposed, which can convert the IDD behavior of the boost converter into that of an equivalent simple-inductive-circuit (SIC). According to the energy equivalence, the equivalent inductor-current of the equivalent SIC is obtained. It is indicated that the equivalent inductor-current (EIC) is much more than the maximal inductor-current of the boost converter, the ignition in the case of IDD may occurs even if the inductor-current of the boost converter is much lower than that of the SIC, furthermore, the EIC is strengthened with increase of the output capacitance. The proposed analysis method is verified by experiment results.
Keywords :
electrical safety; power convertors; boost DC-DC converters; equivalent simple-inductive-circuit; equivalent-resistance-analysis method; inductor-disconnected-discharge behavior; intrinsic safety behavior; Circuits; DC-DC power converters; Explosives; Ignition; Pulse width modulation; Safety; Silicon carbide; Sparks; Switching converters; Voltage; Boost DC-DC converter; Inductor-Disconnected-Discharge; Intrinsic safety; inductor-current;
Conference_Titel :
Information Assurance and Security, 2009. IAS '09. Fifth International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-0-7695-3744-3
DOI :
10.1109/IAS.2009.94