Title :
A calibrated pathfinding model for signal integrity analysis on interposer
Author :
Kim, Jaemin ; Kim, Sunyoung ; Ryckaert, Julien ; Detalle, Mikael ; Van Hoovels, Nele ; Marchal, Pol
Author_Institution :
imec, Leuven, Belgium
Abstract :
A calibrated pathfinding on silicon interposer is presented for exploring the impact of interconnect geometries on signal integrity. ABCD matrix-based model and single bit method are used for the pathfinding by estimating the worst-case eye opening. Experiment-based eye-diagrams using measured S-parameters on the fabricated silicon interposer are compared with the pathfinding showing 6% max difference. The pathfinding utilizes to optimize design parameters with 99% reduce of simulation time. It also extends for the optimization of parameters in multi interconnects considering mutual effects as well as crosstalk.
Keywords :
S-parameters; circuit optimisation; geometry; integrated circuit design; integrated circuit interconnections; ABCD matrix-based model; S-parameter; calibrated pathfinding model; crosstalk; experiment-based eye-diagram; fabricated silicon interposer; interconnect geometry; multiinterconnects; optimize design parameter; signal integrity analysis; single bit method; Clocks; Computational modeling; Crosstalk; Integrated circuit interconnections; Silicon; Transfer functions; Transmission line matrix methods;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330688
