Title :
Improved Abstractions and Turnaround Time for FPGA Design Validation and Debug
Author :
Iskander, Yousef S. ; Patterson, Cameron D. ; Craven, Stephen D.
Author_Institution :
Bradley Dept. of ECE, Virginia Tech, Blacksburg, VA, USA
Abstract :
Rapidly increasing FPGA density and complexity has heightened the need for higher levels of abstraction in validation and more rapid, focused approaches for design inspection. We present two methods of validating and debugging active, implemented FPGA designs running at target speeds. The first binds high-level software reference models directly to hardware enabling complex, automated, software-controlled testing scenarios, reducing the reliance on simulation. The second approach provides direct interactivity and visibility into a running FPGA design, enabling software-controlled breakpoints and arbitrary access to design registers. In-circuit breakpoints can be modified without the need to re-implement the entire design.
Keywords :
field programmable gate arrays; inspection; integrated circuit design; program debugging; program testing; FPGA design validation; abstractions; debug; design inspection; hardware enabling complex; high-level software reference models; in-circuit breakpoints; register design; software-controlled breakpoints; software-controlled testing scenarios; turnaround time; Clocks; Debugging; Field programmable gate arrays; Hardware; Registers; Software; System-on-a-chip; FPGA; debug; validation;
Conference_Titel :
Field Programmable Logic and Applications (FPL), 2011 International Conference on
Conference_Location :
Chania
Print_ISBN :
978-1-4577-1484-9
Electronic_ISBN :
978-0-7695-4529-5
DOI :
10.1109/FPL.2011.102