Title :
Electronic design automation (EDA) solutions for ESD-robust design and verification
Author :
Khazhinsky, Michael G. ; Cao, Shuqing ; Gossner, Harald ; Boselli, Gianluca ; Etherton, Melanie
Author_Institution :
Silicon Labs., Inc., Austin, TX, USA
Abstract :
The paper describes the essential requirements of the Electrostatic Discharge (ESD) EDA verification flow to be aligned within the IC design community. The proposed flow offers a systematic approach to check ESD robustness across all IC blocks during the product definition, chip architecture, main module and full IC design phases, and during the final IC verification. This flow is substantiated by case studies of key ESD checks at different IC design stages, demonstrating the necessity of replacing manual checks with EDA tool enabled verification.
Keywords :
electronic design automation; electrostatic discharge; EDA tool enabled verification; ESD robust design; IC blocks; IC design community; IC verification; check ESD robustness; chip architecture; electronic design automation solution; electrostatic discharge EDA verification flow; full IC design phase; Electrostatic discharges; IP networks; Integrated circuits; Libraries; Performance evaluation; Rails;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2012 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1555-5
Electronic_ISBN :
0886-5930
DOI :
10.1109/CICC.2012.6330690