Title :
Design for reliability
Author :
Mourad, Samiha ; Fujiwara, Hideo
Author_Institution :
Santa Clara Univ., CA, USA
Abstract :
This paper explores an important aspect VLSI design: how can the design processes assure that a product is reliable. While reliability is closely related to yield, we will show that it is not sufficient to improve yield to assure high reliability. This is the first stage in exploring the topic and needs further study to reach some practical approach for design for reliability. In this paper we explore a methodology to guide the engineer´s design choices toward an optimal implementation of reliable VLSI design.
Keywords :
VLSI; circuit optimisation; integrated circuit design; integrated circuit reliability; integrated circuit yield; optimised production technology; VLSI design; design for reliability; known good chips; logic synthesis; optimal implementation; physical design; total number of chips; yield; Consumer electronics; Cost function; Fabrication; Information processing; Information science; Nanoelectronics; Process design; Product design; Profitability; Time to market;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
Print_ISBN :
0-7803-8248-X
DOI :
10.1109/IMTC.2004.1351488
