• DocumentCode
    1807443
  • Title

    A 12-bit 50-MS/s 3.3-mW SAR ADC with background digital calibration

  • Author

    Liu, Wenbo ; Huang, Pingli ; Chiu, Yun

  • Author_Institution
    Broadcom Corp., Irvine, CA, USA
  • fYear
    2012
  • fDate
    9-12 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper describes a background digital calibration technique based on bitwise correlation (BWC) to correct the capacitive digital-to-analog converter (DAC) mismatch error in successive-approximation-register (SAR) analog-to-digital converters (ADC´s). Aided by a single-bit pseudorandom noise (PN) injected to the ADC input, the calibration engine extracts all bit weights simultaneously to facilitate a digital-domain correction. The analog overhead associated with this technique is negligible and the conversion speed is fully retained (in contrast to [1] in which the ADC throughput is halved). A prototype 12bit 50-MS/s SAR ADC fabricated in 90-nm CMOS measured a 66.5-dB peak SNDR and an 86.0-dB peak SFDR with calibration, while occupying 0.046 mm2 and dissipating 3.3 mW from a 1.2-V supply. The calibration logic is estimated to occupy 0.072 mm2 with a power consumption of 1.4 mW in the same process.
  • Keywords
    analogue-digital conversion; approximation theory; calibration; digital-analogue conversion; ADC input; BWC; CMOS technology; SAR ADC; SFDR; analog overhead; background digital calibration technique; bit rate 50 Mbit/s; bitwise correlation; capacitive DAC mismatch error; capacitive digital-to-analog converter mismatch error; digital-domain correction; power 1.4 mW; power 3.3 mW; single-bit PN; single-bit pseudorandom noise; size 90 nm; successive-approximation-register analog-to-digital converters; voltage 1.2 V; word length 12 bit; Algorithm design and analysis; CMOS integrated circuits; Calibration; Capacitors; Correlation; Noise; Prototypes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2012 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4673-1555-5
  • Electronic_ISBN
    0886-5930
  • Type

    conf

  • DOI
    10.1109/CICC.2012.6330694
  • Filename
    6330694