DocumentCode :
180776
Title :
A hierarchical formal approach to verifying side-channel resistant cryptographic processors
Author :
Okamoto, K. ; Homma, Noriyasu ; Aoki, Toyohiro ; Morioka, Sumio
Author_Institution :
Grad. Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan
fYear :
2014
fDate :
6-7 May 2014
Firstpage :
76
Lastpage :
79
Abstract :
This paper presents a hierarchical formal verification method for cryptographic processors based on a combination of a word-level computer algebra procedure and a bit-level decision procedure using PPRM (Positive Polarity Reed-Muller) expansion. In the proposed method, the entire datapath structure of a cryptographic processor is described in the form of a hierarchical graph . The correctness of the entire circuit function is verified on this graph representation, by the algebraic method, and the function of each component is verified by the PPRM method, respectively. We have applied the proposed verification method to a complicated AES (Advanced Encryption Standard) circuit with a masking countermeasure against side-channel attack. The results show that the proposed method can verify such practical circuit automatically within 4 minutes while the conventional methods fail.
Keywords :
Reed-Muller codes; cryptography; digital arithmetic; formal verification; graph theory; process algebra; AES circuit; PPRM; advanced encryption standard circuit; algebraic method; bit-level decision procedure; circuit function; datapath structure; graph representation; hierarchical formal approach; hierarchical formal verification method; hierarchical graph; positive polarity Reed-Muller expansion; side-channel attack; side-channel resistant cryptographic processors; word-level computer algebra procedure; Algebra; Computers; Cryptography; Polynomials; Program processors; Resistance; Galois fields; arithmetic circuits; cryptographic processors; design methodology for secure hardware; formal design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Hardware-Oriented Security and Trust (HOST), 2014 IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4799-4114-8
Type :
conf
DOI :
10.1109/HST.2014.6855572
Filename :
6855572
Link To Document :
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