Title : 
The performance analysis of direct sampling microwave radiometer
         
        
            Author : 
Lu, Zhu ; Fei, Hu ; Qingxia, Li ; Yaoting, Zhu
         
        
            Author_Institution : 
Dept. of Electron. & Inf. Eng., Huazhong Univ. of Sci. & Technol., Wuhan
         
        
        
        
        
        
        
            Abstract : 
L-band direct sampling digital total power microwave radiometer (DSDTPMR) is a novel radiometer, which trades analog complexity for digital ditto. This article considered the low noise amplifier (LNA) gain fluctuation, analog-to-digital converter (ADC) sampling rates and quantization resolution, to derive a general mathematical expression of sensitivity of the DSDTPMR; Analyzed the influence of sampling rate, quantization on sensitivity of DSDTPMR; The simulation result indicating, when the sampling frequency is bigger than two times of signal bandwidth, the multi-bit quantization resolution has very small effect on the sensitivity; when the gain fluctuation obeys the Gaussian distribution, the gain fluctuation may reduce to radicN times.
         
        
            Keywords : 
Gaussian distribution; UHF circuits; analogue-digital conversion; low noise amplifiers; microwave amplifiers; radiometers; DSDTPMR; Gaussian distribution; L-band direct sampling digital total power microwave radiometer; LNA gain fluctuation; analog complexity; analog-to-digital converter; digital ditto; low noise amplifier; multibit quantization resolution; performance analysis; radicN times; sampling frequency; Distributed amplifiers; Fluctuations; Gaussian noise; L-band; Microwave radiometry; Noise reduction; Performance analysis; Quantization; Sampling methods; Signal resolution; direct sampling; microwave radiometer; sensitivity;
         
        
        
        
            Conference_Titel : 
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
         
        
            Conference_Location : 
Nanjing
         
        
            Print_ISBN : 
978-1-4244-1879-4
         
        
            Electronic_ISBN : 
978-1-4244-1880-0
         
        
        
            DOI : 
10.1109/ICMMT.2008.4540523