Title :
On-chip resonant supply noise reduction utilizing switched parasitic capacitors of sleep blocks with tri-mode power gating structure
Author :
Jinmyoung Kim ; Nakura, Toru ; Takata, Hiroto ; Ishibashi, Koji ; Ikeda, Makoto ; Asada, Kunihiro
Author_Institution :
Dept. of Electron. Eng., Univ. of Tokyo, Tokyo, Japan
Abstract :
Switched parasitic capacitors of sleep blocks with a tri-mode power gating structure are implemented to reduce on-chip resonant supply noise in 65 nm CMOS process. The proposed method achieves 46.9% and 57.9% noise reduction for wake-up noise and 130 MHz periodic supply noise, respectively. The proposed method also realizes without discharging time before noise cancelling, and shows a 8.4× boost of effective capacitance value with 2.1% chip area overhead. To apply the proposed switched parasitic capacitors of sleep blocks for reducing resonant supply noise, we can save chip area for noise reduction more effectively.
Keywords :
CMOS integrated circuits; capacitors; CMOS process; frequency 130 MHz; on-chip resonant supply noise reduction; periodic supply noise; resonant supply noise; size 65 nm; sleep block; switched parasitic capacitor; trimode power gating structure; wake-up noise; Capacitors; Leakage current; Logic gates; Noise; Noise reduction; Switches; System-on-a-chip;
Conference_Titel :
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location :
Helsinki
Print_ISBN :
978-1-4577-0703-2
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2011.6044895