Title :
Differential input topologies with immunity to electromagnetic interference
Author :
Michel, Fridolin ; Steyaert, Michiel
Author_Institution :
Dept. Elektrotech. ESAT-MICAS, K.U. Leuven, Leuven, Belgium
Abstract :
Differential input structures and their immunity to electromagnetic interference (EMI) are discussed and measured. EMI signals coupling into analog circuits can have levels of up to 40 Vpp according to recent industrial EMI specifications [6]. In order to maintain circuit operation under such high disturbances several on chip modifications of standard circuitry are proposed. Low EMI levels can be partly handled by high impedance input structures, whereas for the full EMI specification of 40 Vpp a low input impedance structure has been developed, that prevents ESD clipping by EMI attenuation to the chip voltage range while calibrating for mismatch induced signal deterioration.
Keywords :
CMOS analogue integrated circuits; electromagnetic interference; electrostatic discharge; network topology; CMOS process; EMI attenuation; EMI signal coupling; ESD clipping; analog circuit; calibration; chip modification; differential input topology; electromagnetic interference; industrial EMI specification; low input impedance structure; signal deterioration; voltage 40 V; Calibration; Delta modulation; Electromagnetic compatibility; Electromagnetic interference; Impedance; Impedance measurement; Topology;
Conference_Titel :
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location :
Helsinki
Print_ISBN :
978-1-4577-0703-2
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2011.6044900