• DocumentCode
    1808024
  • Title

    Exploring new analog test methods with Eagle Tester (test vehicle: OVIC)

  • Author

    Teck, Lim Wee

  • Author_Institution
    SCG Ind., ON Semicond., Negeri Sembilan, Malaysia
  • fYear
    2002
  • fDate
    19-21 Dec. 2002
  • Firstpage
    409
  • Lastpage
    414
  • Abstract
    This report details the development on Analog IC devices, the OVIC (Over Voltage Protection IC) on the Eagle Test System (ETS) tester platform. New test interface design and setup were evaluated. These setups were considered with the in-house test handler platform in mind. The setups were mainly constrained by physical space constrains. The effects of cable length on DUT performance and floating versus grounded DUT were also evaluated. This development was primarily motivated by test accuracy, efficiency and effectiveness on the ETS. The output response of the experiment were voltage, current and timing. Results indicate that with short test cable and grounded DUT, very repeatable readings could be achieved. Longer test cables or a floating DUT setup would require proper characterisation of the test setup if any of these is to be implemented.
  • Keywords
    analogue integrated circuits; design for testability; integrated circuit testing; overvoltage protection; DUT; Eagle tester; analog IC devices; analog test; device under test; over voltage protection IC; Analog integrated circuits; Assembly systems; Circuit testing; Costs; Integrated circuit testing; Packaging; Semiconductor device testing; System testing; Vehicles; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
  • Print_ISBN
    0-7803-7578-5
  • Type

    conf

  • DOI
    10.1109/SMELEC.2002.1217854
  • Filename
    1217854