DocumentCode
1808024
Title
Exploring new analog test methods with Eagle Tester (test vehicle: OVIC)
Author
Teck, Lim Wee
Author_Institution
SCG Ind., ON Semicond., Negeri Sembilan, Malaysia
fYear
2002
fDate
19-21 Dec. 2002
Firstpage
409
Lastpage
414
Abstract
This report details the development on Analog IC devices, the OVIC (Over Voltage Protection IC) on the Eagle Test System (ETS) tester platform. New test interface design and setup were evaluated. These setups were considered with the in-house test handler platform in mind. The setups were mainly constrained by physical space constrains. The effects of cable length on DUT performance and floating versus grounded DUT were also evaluated. This development was primarily motivated by test accuracy, efficiency and effectiveness on the ETS. The output response of the experiment were voltage, current and timing. Results indicate that with short test cable and grounded DUT, very repeatable readings could be achieved. Longer test cables or a floating DUT setup would require proper characterisation of the test setup if any of these is to be implemented.
Keywords
analogue integrated circuits; design for testability; integrated circuit testing; overvoltage protection; DUT; Eagle tester; analog IC devices; analog test; device under test; over voltage protection IC; Analog integrated circuits; Assembly systems; Circuit testing; Costs; Integrated circuit testing; Packaging; Semiconductor device testing; System testing; Vehicles; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2002. Proceedings. ICSE 2002. IEEE International Conference on
Print_ISBN
0-7803-7578-5
Type
conf
DOI
10.1109/SMELEC.2002.1217854
Filename
1217854
Link To Document