Title :
Initial operation of an ultra-compact, low voltage Reltron microwave source
Author :
Choi, S.H. ; Schamiloglu, E. ; Miller, Raymond B.
Author_Institution :
New Mexico Univ., Albuquerque, NM, USA
Abstract :
Summary form only given, as follows. The paper presents in detail the design and initial operating characteristics of an-ultra-compact, low voltage Reltron source. This device was custom-designed and built by Titan/PSI for the University of New, Mexico. The initial motivation for developing such a source was for use in a graduate pulsed power and plasma science laboratory course. The low voltage and compact nature of the system, packaged in a "turn-key" system, makes it an ideal source for studying the basic operating principles of a Reltron. Whereas the source preserves the fundamental operating characteristics of a Reltron (including the post-acceleration gap) the low voltage driver (on the order of 100 kV) limits the microwave power levels that are generated. We present cold test results of the cavity, pulsed power characteristics of the driver, as well as initial microwave generation studies. We also discuss possible applications of this ultra-compact source.
Keywords :
electron tube testing; microwave generation; microwave tubes; 100 kV; Reltron source; Titan/PSI; University of New Mexico; applications; cavity; cold test results; design; driver; fundamental operating characteristics; graduate pulsed power course; ideal source; initial microwave generation studies; initial operating characteristics; low voltage driver; microwave power levels; operating principles; plasma science laboratory course; post-acceleration gap; pulsed power characteristics; turn-key system; ultra-compact low voltage Reltron microwave source; ultra-compact source; Character generation; Laboratories; Low voltage; Microwave devices; Microwave generation; Nuclear and plasma sciences; Packaging; Power generation; Testing;
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
DOI :
10.1109/PPPS.2001.961288