DocumentCode
1808392
Title
Light confinement in low contrast slot waveguide structures investigated
Author
Iqbal, Muddassir ; Zheng, Zheng ; Liu, Jiansheng
Author_Institution
Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing
Volume
2
fYear
2008
fDate
21-24 April 2008
Firstpage
878
Lastpage
881
Abstract
The advent of slot waveguide structure has led the field of nano-photonics into an era, where maximum light can be confined inside low index slot guarded by high index slabs. Already in use slot waveguides (contrast ratio is 2.42) have two distinct properties over the conventional waveguides, i.e. high E-field amplitude, optical power, optical intensity in low index materials and a strong E-field confinement is localized to nanometer-size low index regions. We hereby propose a low contrast double slot waveguide structure (contrast ratio is 1.65); where low index slots comprising of air surrounded with high index glass slabs. The whole structure is based on substrate comprising of glass whereas cladding is of air. Novelty lies in showing high E-field amplitude, optical power, optical intensity and a strong E-field confinement in low index slot regions. Low contrast double slot structure usage in forming passive nano-devices had been verified by simulating a Y-branch coupler.
Keywords
nanotechnology; optical waveguides; silicon-on-insulator; Y-branch coupler; high E-field amplitude; high index glass slabs; light confinement; low contrast double slot waveguide structure; low contrast slot waveguide structures; nanophotonics; optical intensity; optical power; passive nanodevices; Biomedical optical imaging; Nanobioscience; Optical refraction; Optical sensors; Optical variables control; Optical waveguide theory; Optical waveguides; Refractive index; Silicon on insulator technology; Slabs; FDTD; SOI (Silicon on Insulator); Slot Waveguides; quasi-TE;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location
Nanjing
Print_ISBN
978-1-4244-1879-4
Electronic_ISBN
978-1-4244-1880-0
Type
conf
DOI
10.1109/ICMMT.2008.4540544
Filename
4540544
Link To Document