DocumentCode :
1808566
Title :
Investigation of the key sampling parameters of antenna time domain planar near field measurement
Author :
Chang, Ren ; Xue, Zheng-hui ; Wang, Nan ; Yang, Shi-ming
Author_Institution :
Dept. of Electron. Eng., Beijing Inst. of Technol., Beijing
Volume :
2
fYear :
2008
fDate :
21-24 April 2008
Firstpage :
910
Lastpage :
913
Abstract :
Investigation of optimizing the scanning setup parameters of the sampling system in antenna time domain planar near field measurement is described in this paper. Based on this technique, the sample waveforms are got more accurately in practical experiments. From the measuring results, the measuring results and sample efficiency are much influenced by sample setup can be found. So it is very necessary to find the best setup parameters through research.
Keywords :
antenna theory; measurement systems; sampling methods; time-domain analysis; antenna time domain planar near field measurement; key sampling parameters; sample setup; Antenna measurements; Antenna theory; Electromagnetic measurements; Fourier transforms; Frequency domain analysis; Probes; Sampling methods; Signal sampling; Space technology; Time measurement; near field measurement; near-field-far-field transformations; sampling parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-1879-4
Electronic_ISBN :
978-1-4244-1880-0
Type :
conf
DOI :
10.1109/ICMMT.2008.4540553
Filename :
4540553
Link To Document :
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