DocumentCode
1808699
Title
CMOS 3D image sensor based on pulse modulated time-of-flight principle and intrinsic lateral drift-field photodiode pixels
Author
Spickermann, Andreas ; Durini, Daniel ; Süss, Andreas ; Ulfig, Wiebke ; Brockherde, Werner ; Hosticka, Bedrich J. ; Schwope, Stefan ; Grabmaier, Anton
Author_Institution
Fraunhofer Inst. for Microelectron. Circuits & Syst. (IMS), Duisburg, Germany
fYear
2011
fDate
12-16 Sept. 2011
Firstpage
111
Lastpage
114
Abstract
Design and measurement results of a CMOS 128 × 96 pixel sensor are presented, which can be used for three-dimensional (3D) scene reconstruction applications based on indirect time-of-flight (ToF) principle enabled by pulse modulated active laser illumination. The 40μm pitch pixels are based on the novel intrinsic lateral drift-field photodiode (LDPD) that allows for a 30ns complete charge transfer from the photoactive area into the readout node, and accumulation of signal charge over several readout cycles for extended signal-to-noise ratio (SNR). Distance measurements have been performed using a specially developed camera system.
Keywords
CMOS image sensors; distance measurement; photodiodes; CMOS 3D image sensor; camera system; distance measurements; indirect time-of-flight principle; intrinsic lateral drift-field photodiode pixels; pulse modulated active laser illumination; pulse modulated time-of-flight principle; signal-to-noise ratio; three-dimensional scene reconstruction; CMOS integrated circuits; Cameras; Electric potential; Image sensors; Measurement by laser beam; Photodiodes; Three dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location
Helsinki
ISSN
1930-8833
Print_ISBN
978-1-4577-0703-2
Electronic_ISBN
1930-8833
Type
conf
DOI
10.1109/ESSCIRC.2011.6044927
Filename
6044927
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