DocumentCode :
1809016
Title :
Building blocks for an X-band SiGe BiCMOS T/R module
Author :
Dinc, Tolga ; Kalyoncu, I. ; Kaynak, Mehmet ; Gurbuz, Yasar
Author_Institution :
Fac. of Eng. & Natural Sci. - FENS, Orhanli - Tuzla, Istanbul, Turkey
fYear :
2013
fDate :
21-23 Jan. 2013
Firstpage :
201
Lastpage :
203
Abstract :
This paper presents the building blocks of an X-Band T/R module in a 0.25 μm SiGe BiCMOS technology for phased arrays. The T/R module consists of a T/R switch, two SPDT switches, a power amplifier, a low noise amplifier, a phase shifter and a variable gain amplifier (not presented). The T/R switch, SPDT switch and the phase shifter are implemented using CMOS transistors whereas the PA and LNA are based on SiGe HBTs. The designed T/R switch achieves minimum insertion loss of 2.1 dB, an isolation of 42 dB and has an input PldB of 27.4 dBm at 10 GHz. The SPDT switch has less than 2.2 dB loss at X-Band. The PA resulted in a small-signal gain of 25 dB and a saturated output power of 23.2 dBm with 25 % PAE. The LNA has 1.65 dB noise figure (mean) with a gain more than 19 dB at X-Band. Lastly, the phase shifter achieves simulated RMS phase and gain errors of 1°-3.5° and 0.8-1.8 dB at X-Band.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; low noise amplifiers; phase shifters; phased array radar; power amplifiers; switches; BiCMOS technology; CMOS transistors; SPDT switches; SiGe; T/R switch; X-band BiCMOS T/R module; frequency 10 GHz; gain 25 dB; gain errors; insertion loss; isolation loss; loss 2.1 dB; loss 42 dB; low noise amplifier; noise figure 1.65 dB; phase shifter; phased arrays; power amplifier; saturated output power; simulated RMS phase; size 0.25 mum; small-signal gain; variable gain amplifier; Gain; Insertion loss; Loss measurement; Phase shifters; Power amplifiers; Silicon germanium; Switches; CMOS switch; Phased array; T/R module; low noise amplifier; phase shifter; power amplifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2013 IEEE 13th Topical Meeting on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-1552-4
Electronic_ISBN :
978-1-4673-1551-7
Type :
conf
DOI :
10.1109/SiRF.2013.6489479
Filename :
6489479
Link To Document :
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