Title :
A Novel Circuit for Transition-Edge Detection: Using a Stochastic Comparator Group to Test Transition-Edge
Author :
Yamaguchi, Takahiro J. ; Tandon, James S. ; Komatsu, Satoshi ; Asada, Kunihiro
Author_Institution :
Advantest Labs. Ltd., Sendai, Japan
Abstract :
Traditional binary transition-edge search methods are sensitive to hysteresis, noise and jitter, and also require a relatively large number of samples in order to accurately detect a noisy transition edge. A new transition-edge search circuit is introduced in this paper which utilizes a stochastic comparator group. By incorporating stochastic properties, our proposed circuit design accelerates the accumulation of data and enhances test quality. The background theory underlying this approach is developed and experimentally validated in this paper.
Keywords :
comparators (circuits); integrated circuit testing; jitter; search problems; stochastic processes; binary transition-edge search methods; circuit design; data accumulation; hysteresis; jitter; noisy transition edge; stochastic comparator group; stochastic properties; test quality; transition-edge detection; transition-edge search circuit; Fluctuations; Image edge detection; Signal to noise ratio; Stochastic processes; Testing; Timing; binary search; comparator; linear search; offset voltage variance; time offset variance;
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
DOI :
10.1109/ATS.2014.40