• DocumentCode
    180914
  • Title

    A Resizing Method to Minimize Effects of Hardware Trojans

  • Author

    Byeongju Cha ; Gupta, Suneet K.

  • Author_Institution
    Ming Hsieh Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    2014
  • fDate
    16-19 Nov. 2014
  • Firstpage
    192
  • Lastpage
    199
  • Abstract
    Due to emerging threats of hardware Trojan insertion, many techniques to detect Trojans and protect the original design have been developed. However, an intelligent adversary is expected to be aware of every state-of-the-art detection technique and develop new countermeasures to make a majority of these obsolete. In this paper, we propose and analyze a new attack scenario that targets every known non-destructive detection method and imposes negligible impact on every measurable circuit parameter. We start by introducing our key ideas for hiding the delay impact of the Trojan via gate resizing. The gate resizing problem is then formulated and implemented. Our method redesigns the circuit at minimal cost without affecting the functionality of the circuit, can be applied in conjunction with any other attack scenario, and maintains its benefit independent of the type and functionality of Trojan circuitry. Finally, via extensive experiments on benchmarks we demonstrate that our method greatly increases the difficulty of detecting Trojans via any combination of delay, current, and power measurements and has very small area overhead.
  • Keywords
    hardware-software codesign; integrated circuit design; integrated circuit testing; invasive software; Trojan via gate resizing; circuit parameter; detection technique; hardware Trojan insertion; nondestructive detection method; resizing method; Current measurement; Delays; Logic gates; Power demand; Power measurement; Semiconductor device measurement; Trojan horses; delay measurement; gate resizing; hardware Trojan; parametric test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2014 IEEE 23rd Asian
  • Conference_Location
    Hangzhou
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2014.44
  • Filename
    6979099