DocumentCode
1809279
Title
Statistical characteristic of scattering from randomly rough surfaces
Author
Geng, Zhang ; Zhensen, Wu ; Hanlu, Zhang
Author_Institution
Sci. Sch., Xidian Univ., Xi´´an
Volume
2
fYear
2008
fDate
21-24 April 2008
Firstpage
991
Lastpage
994
Abstract
An analytical expression for the fourth order moment of the plane wave scattering from two-dimensional randomly rough surface with small roughness is presented based on the Kirchhoff and physical optics approximation. The fourth order moment has been simplified to get the two-position and two-frequency mutual correlation function. With the incidence wavelength 1.06 mum and different root-mean-square (rms) heights, the distributions of FOM changing with the coherence bandwidth frequency difference and scattering angles have been given. It is shown that the rms height of rough surface greatly influences on results and the scattered FOM mainly comes from the specular direction and zero frequency difference with small rms height. If the frequency difference is greater than zero, FOM will quickly decreases to zero in other directions; while at zero frequency, with the increase of rms height, there is also the biggest value which is smaller than that with smaller rms height, and the value in specular direction decreases but others increase, which we call "speckle effect". In addition, the increase of rms height results in the correlation bandwidth narrowing.
Keywords
electromagnetic wave scattering; physical optics; rough surfaces; statistical analysis; 2D randomly rough surface; analytical expression; coherence bandwidth frequency difference; correlation bandwidth narrowing; fourth order moment; mutual correlation function; physical optics approximation; plane wave scattering; randomly rough surfaces; root-mean-square heights; scattering angles; speckle effect; specular direction; statistical characteristics; zero frequency difference; Bandwidth; Coherence; Frequency; Optical scattering; Optical surface waves; Physical optics; Rough surfaces; Speckle; Surface roughness; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location
Nanjing
Print_ISBN
978-1-4244-1879-4
Electronic_ISBN
978-1-4244-1880-0
Type
conf
DOI
10.1109/ICMMT.2008.4540576
Filename
4540576
Link To Document