DocumentCode :
1809594
Title :
A standard cell based all-digital Time-to-Digital Converter with reconfigurable resolution and on-line background calibration
Author :
Vengattaramane, Kameswaran ; Borremans, Jonathan ; Steyaert, Michiel ; Craninckx, Jan
Author_Institution :
SSET-Wireless, IMEC, Leuven, Belgium
fYear :
2011
fDate :
12-16 Sept. 2011
Firstpage :
275
Lastpage :
278
Abstract :
This paper presents a standard-cell based All-Digital Time-to-Digital Converter with reconfigurable resolution reaching sub-gate delay. The architecture based on spatial oversampling is implemented with an automated digital design flow. It features a robust online background calibration scheme for gain tracking. A 90 nm prototype chip achieves [39-14] ps effective resolution consuming [1-8] mA, in an area of only 0.26 mm2.
Keywords :
calibration; convertors; phase detectors; all-digital time-to-digital converter; gain tracking; on-line background calibration; reconfigurable resolution; spatial oversampling; standard cell; sub-gate delay; Calibration; Computer architecture; Delay; Phase locked loops; Quantization; Radiation detectors; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location :
Helsinki
ISSN :
1930-8833
Print_ISBN :
978-1-4577-0703-2
Electronic_ISBN :
1930-8833
Type :
conf
DOI :
10.1109/ESSCIRC.2011.6044960
Filename :
6044960
Link To Document :
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