DocumentCode :
1809756
Title :
A fully integrated CMOS power amplifier for LTE-applications using clover shaped DAT
Author :
François, Brecht ; Reynaert, Patrick
Author_Institution :
ESAT-MICAS, Katholieke Univ. Leuven, Leuven, Belgium
fYear :
2011
fDate :
12-16 Sept. 2011
Firstpage :
303
Lastpage :
306
Abstract :
In this paper, a Distributed Active Transformer (DAT) is used to implement a fully-integrated RF power amplifier (PA) for the extended GSM-band and LTE band VIII in a standard 90 nm CMOS process. The DAT allows the designer to integrate both the input and output matching networks as the power combining itself on the same silicon die. The PA delivers up to 29.4 dBm of RF power with 28.4% drain efficiency and a power added efficiency (PAE) of 25.8% by using a 2 V supply voltage. The PA is measured for both GSM-signals and LTE-signals. For GSM, the maximum output power is 29.1 dBm. The corresponding output spectrum at 400 kHz and 600 kHz frequency offset is -68 dBc and -70 dBc and meets the spectral mask requirements. The Power versus Time (PvT) measurement shows that the time domain constraints are met. When applying a LTE-signal with 10 MHz bandwidth and a PAPR of 6.92 dB to the RF PA, the designed PA meets the EVM specification at 25 dBm average output power with 15% PAE.
Keywords :
CMOS analogue integrated circuits; Long Term Evolution; UHF power amplifiers; cellular radio; impedance convertors; power combiners; silicon; time-domain analysis; EVM specification; GSM-signal; LTE band; LTE-application; LTE-signal; PvT measurement; clover shaped DAT; distributed active transformer; drain efficiency; extended GSM-band; frequency 400 kHz; frequency 600 kHz; fully integrated CMOS power amplifier; fully-integrated RF power amplifier; matching networks; power added efficiency; power combining; power versus time measurement; silicon die; size 90 nm; time domain constraint; voltage 2 V; CMOS integrated circuits; Couplings; Impedance; Power generation; Power measurement; Radio frequency; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location :
Helsinki
ISSN :
1930-8833
Print_ISBN :
978-1-4577-0703-2
Electronic_ISBN :
1930-8833
Type :
conf
DOI :
10.1109/ESSCIRC.2011.6044967
Filename :
6044967
Link To Document :
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