DocumentCode
1810032
Title
Polymer piezoelectret films with ordered structure
Author
Sun, Zhuan-lan ; Zhang, Xiao-qing ; Cao, Gong-xun ; Wang, Xue-wen ; Lou, Ke-xing ; Li, Hong-qiang ; Xia, Zhong-fu
Author_Institution
Pohl Inst. of Solid-State Phys., Tongji Univ., Shanghai, China
fYear
2009
fDate
17-20 Dec. 2009
Firstpage
118
Lastpage
118
Abstract
Preparation of piezoelectret films with ordered void structure by using a template method is described. The structure of films consists of two layers of non-porous fluoroethypropylene (FEP) and one layer of non-porous polytetrafluorothylene (PTFE). The piezoelectricity of such fluorocarbon polymer films is investigated by measuring the quasi-static piezoelectric d33 coefficients using positive piezoelectric effect. And the thermal stability of the films is studied by taking the measurement of d33 decay at elevated temperatures. The results show that the quasi-static piezoelectric d33 coefficients around 300 pC/N are achieved and its Young´s modulus is about 0.28 MPa. Compared with the fluorocarbon polymer films with disordered void structure, the films with ordered structure shows a much improved thermal stability of d33. Pre-aging treatment can further improve the thermal stability of d33.
Keywords
Young´s modulus; ageing; piezoelectric thin films; polymer films; thermal stability; voids (solid); Young´s modulus; d33 decay; disordered void structure; fluorocarbon polymer films; nonporous fluoroethypropylene; nonporous polytetrafluorothylene; ordered void structure; piezoelectricity; polymer piezoelectret films; preaging treatment; quasistatic piezoelectric d33 coefficients; template method; thermal stability; Physics; Piezoelectric effect; Piezoelectric films; Piezoelectricity; Polymer films; Solid state circuits; Sun; Temperature; Thermal stability; ordered structure; piezoelectret; piezoelectricity; thermal stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA) and 2009 China Symposium on Frequency Control Technology, Joint Conference of the 2009 Symposium on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-4950-7
Type
conf
DOI
10.1109/SPAWDA.2009.5428908
Filename
5428908
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