Title :
Regression criteria and their application in different modeling cases
Author :
Leyn, Francky ; Lauwers, Erik ; Vogels, Martin ; Gielen, Georges ; Sansen, Willy
Author_Institution :
Katholieke Univ., Leuven, Belgium
Abstract :
Different regression criteria exhibit different properties when used for fitting purposes. In this paper the properties of different regression criteria are described in detail. The underlying error structure and the link between the regression criterion and the application area is analysed. Examples in different modeling areas are provided. Given are an example of device modeling, system-level modeling, and the temperature decay of a biomedical sensor chip. The examples show that there doesn´t exist an ideal regression criterion. The most appropriate regression criterion depends on the constitution of the total error. This makes fitting a multiple step process. Only after some trial fittings one is able to determine the most appropriate regression criterion for a given application.
Keywords :
integrated circuit modelling; least squares approximations; maximum likelihood estimation; measurement errors; minimax techniques; statistical analysis; application area; biomedical sensor chip; device modeling; error structure; multiple step process; regression criteria; system-level modeling; temperature decay; Biosensors; Computer aided software engineering; Constitution; Gaussian distribution; Mathematical model; Measurement errors; Minimax techniques; Parameter extraction; Stochastic resonance; Temperature sensors;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010646
