DocumentCode :
1810943
Title :
A 40nm 50S/s–8MS/s ultra low voltage SAR ADC with timing optimized asynchronous clock generator
Author :
Sekimoto, Ryota ; Shikata, Akira ; Kuroda, Tadahiro ; Ishikuro, Hiroki
Author_Institution :
Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
fYear :
2011
fDate :
12-16 Sept. 2011
Firstpage :
471
Lastpage :
474
Abstract :
This paper presents an ultra low power and low voltage successive-approximation-register (SAR) analog-to-digital converter (ADC) that uses an adaptive timing optimized asynchronous clock generator. Compared to asynchronous converters that use the conventional clock generator, the frequency range is expanded by 50% at 0.4V analog and 0.7V digital power supply voltage. By calibrating the delay time of the clock generator, the DAC settling time is optimized to counter the device mismatch. Test chip has been fabricated in 40nm standard CMOS process and achieved figure of merit (FoM) of 8.75-fJ/conversion-step with 2.048MS/s at 0.6V analog and 0.7V digital power supply voltage. The ADC operates from 50S/s to 8MS/s performing over 7.5-ENOB.
Keywords :
CMOS integrated circuits; analogue-digital conversion; DAC settling time; adaptive timing optimized asynchronous clock generator; asynchronous converters; figure of merit; size 40 nm; standard CMOS process; successive-approximation-register analog-to-digital converter; ultra low voltage SAR ADC; voltage 0.4 V; voltage 0.6 V; voltage 0.7 V; Calibration; Capacitors; Clocks; Delay; Frequency measurement; Generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location :
Helsinki
ISSN :
1930-8833
Print_ISBN :
978-1-4577-0703-2
Electronic_ISBN :
1930-8833
Type :
conf
DOI :
10.1109/ESSCIRC.2011.6045009
Filename :
6045009
Link To Document :
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