DocumentCode
1810943
Title
A 40nm 50S/s–8MS/s ultra low voltage SAR ADC with timing optimized asynchronous clock generator
Author
Sekimoto, Ryota ; Shikata, Akira ; Kuroda, Tadahiro ; Ishikuro, Hiroki
Author_Institution
Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
fYear
2011
fDate
12-16 Sept. 2011
Firstpage
471
Lastpage
474
Abstract
This paper presents an ultra low power and low voltage successive-approximation-register (SAR) analog-to-digital converter (ADC) that uses an adaptive timing optimized asynchronous clock generator. Compared to asynchronous converters that use the conventional clock generator, the frequency range is expanded by 50% at 0.4V analog and 0.7V digital power supply voltage. By calibrating the delay time of the clock generator, the DAC settling time is optimized to counter the device mismatch. Test chip has been fabricated in 40nm standard CMOS process and achieved figure of merit (FoM) of 8.75-fJ/conversion-step with 2.048MS/s at 0.6V analog and 0.7V digital power supply voltage. The ADC operates from 50S/s to 8MS/s performing over 7.5-ENOB.
Keywords
CMOS integrated circuits; analogue-digital conversion; DAC settling time; adaptive timing optimized asynchronous clock generator; asynchronous converters; figure of merit; size 40 nm; standard CMOS process; successive-approximation-register analog-to-digital converter; ultra low voltage SAR ADC; voltage 0.4 V; voltage 0.6 V; voltage 0.7 V; Calibration; Capacitors; Clocks; Delay; Frequency measurement; Generators;
fLanguage
English
Publisher
ieee
Conference_Titel
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location
Helsinki
ISSN
1930-8833
Print_ISBN
978-1-4577-0703-2
Electronic_ISBN
1930-8833
Type
conf
DOI
10.1109/ESSCIRC.2011.6045009
Filename
6045009
Link To Document