• DocumentCode
    1810943
  • Title

    A 40nm 50S/s–8MS/s ultra low voltage SAR ADC with timing optimized asynchronous clock generator

  • Author

    Sekimoto, Ryota ; Shikata, Akira ; Kuroda, Tadahiro ; Ishikuro, Hiroki

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Keio Univ., Yokohama, Japan
  • fYear
    2011
  • fDate
    12-16 Sept. 2011
  • Firstpage
    471
  • Lastpage
    474
  • Abstract
    This paper presents an ultra low power and low voltage successive-approximation-register (SAR) analog-to-digital converter (ADC) that uses an adaptive timing optimized asynchronous clock generator. Compared to asynchronous converters that use the conventional clock generator, the frequency range is expanded by 50% at 0.4V analog and 0.7V digital power supply voltage. By calibrating the delay time of the clock generator, the DAC settling time is optimized to counter the device mismatch. Test chip has been fabricated in 40nm standard CMOS process and achieved figure of merit (FoM) of 8.75-fJ/conversion-step with 2.048MS/s at 0.6V analog and 0.7V digital power supply voltage. The ADC operates from 50S/s to 8MS/s performing over 7.5-ENOB.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; DAC settling time; adaptive timing optimized asynchronous clock generator; asynchronous converters; figure of merit; size 40 nm; standard CMOS process; successive-approximation-register analog-to-digital converter; ultra low voltage SAR ADC; voltage 0.4 V; voltage 0.6 V; voltage 0.7 V; Calibration; Capacitors; Clocks; Delay; Frequency measurement; Generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC (ESSCIRC), 2011 Proceedings of the
  • Conference_Location
    Helsinki
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4577-0703-2
  • Electronic_ISBN
    1930-8833
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2011.6045009
  • Filename
    6045009