• DocumentCode
    1811312
  • Title

    Supercomputer applications to test systems [avionics and weapons applications]

  • Author

    Lam, Han T. ; Porreca, Dave

  • Author_Institution
    Titan Syst. Inc., San Diego, CA, USA
  • fYear
    1988
  • fDate
    4-6 Oct 1988
  • Firstpage
    225
  • Lastpage
    229
  • Abstract
    The applicability of supercomputer technology to test systems is examined. Potential supercomputer applications to test systems such as testing of very high-speed integrated circuit (VHSIC)-based avionics, fault-tolerance and fault-injection testing, and symptom-based diagnosis are discussed
  • Keywords
    aircraft instrumentation; automatic test equipment; automatic testing; fifth generation systems; integrated circuit testing; military systems; weapons; ATE; IC testing; VHSIC; avionics; fault-injection testing; fault-tolerance; supercomputer technology; symptom-based diagnosis; very high-speed integrated circuit; weapons; Aerospace electronics; Circuit faults; Circuit testing; Fault tolerant systems; High speed integrated circuits; Integrated circuit technology; Integrated circuit testing; Supercomputers; System testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
  • Conference_Location
    Minneapolis, MN
  • Type

    conf

  • DOI
    10.1109/AUTEST.1988.9614
  • Filename
    9614