Title :
Natural Failure Mechanisms: Analysis of Actual Field Returns
Author :
Roesch, William J. ; Brockett, Steve
Author_Institution :
TriQuint Semicond., Inc., Hillsboro, OR
Abstract :
Reliability investigations and product qualifications are typically built on a set of standard aging methods which are designed to extract degradation that can be statistically analyzed in order to predict lifetimes. This study is intended to reveal information about what happens in the real world in terms of reliability. This information is provided as an account of experiences with supplier-customer relationships and expectations and to guide aging and qualification methodologies
Keywords :
ageing; customer satisfaction; electronic products; electronics industry; failure analysis; life testing; reliability; actual field returns; aging methods; natural failure mechanisms; product qualifications; reliability investigations; supplier-customer relationships; Aging; Costs; Data mining; Degradation; Design methodology; Failure analysis; Gallium arsenide; Manufacturing; Modems; Qualifications;
Conference_Titel :
ROCS Workshop, 2006. [Reliability of Compound Semiconductors]
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7908-0113-2
DOI :
10.1109/ROCS.2006.323404
