• DocumentCode
    1811752
  • Title

    Higher Order Spectra Analysis of EEG Signals in Emotional Stress States

  • Author

    Hosseini, Seyyed Abed ; Khalilzadeh, Mohammad Ali ; Naghibi-Sistani, Mohammad Bagher ; Niazmand, Vahid

  • Author_Institution
    Mashhad Branch, Young Res. Club, Islamic Azad Univ., Mashhad, Iran
  • fYear
    2010
  • fDate
    24-25 July 2010
  • Firstpage
    60
  • Lastpage
    63
  • Abstract
    This paper proposes an emotional stress recognition system with EEG signals using higher order spectra (HOS). A visual induction based acquisition protocol is designed for recording the EEG signals in five channels (FP1, FP2, T3, T4 and Pz) under two emotional stress states of participants, Calm neutral and Negatively exited. After pre-processing the signals, higher order spectra are employed to extract the features for classifying human emotions. We used Genetic Algorithm for optimum features selection for the classifier. Using the SVM classifier, our study achieved an average accuracy of 82% for the two-above mentioned emotional stress states. We concluded that HOS analysis could be an accurate tool in the assessment of human emotional stress states. We achieved to same results compared to our previous studies.
  • Keywords
    electroencephalography; emotion recognition; feature extraction; genetic algorithms; medical signal processing; signal classification; support vector machines; EEG signals; FP1; FP2; Pz; SVM classifier; T3; T4; acquisition protocol; emotional stress recognition; feature extraction; genetic algorithm; higher order spectra analysis; human emotion classification; visual induction; Accuracy; Electroencephalography; Feature extraction; Kernel; Stress; Support vector machines; Training; EEG Signals; classification; emotional stress; genetic algorithm; higher order spectra;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology and Computer Science (ITCS), 2010 Second International Conference on
  • Conference_Location
    Kiev
  • Print_ISBN
    978-1-4244-7293-2
  • Electronic_ISBN
    978-1-4244-7294-9
  • Type

    conf

  • DOI
    10.1109/ITCS.2010.21
  • Filename
    5557329