DocumentCode :
1812158
Title :
Analysis of large system black-box test data
Author :
Clapp, Kent C. ; Iyer, Ravishankar K. ; Levendel, Ytzhak
Author_Institution :
AT&T Network Syst., Naperville, IL, USA
fYear :
1992
fDate :
7-10 Oct 1992
Firstpage :
94
Lastpage :
103
Abstract :
Studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing costs and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated
Keywords :
data analysis; large-scale systems; program testing; program verification; software quality; AT&T systems; error prone source files; fault information; integrated database; large system black-box test data; repair information; software quality; test minimization; test redundancy; test selection; testing costs; verification; white box analysis; Costs; Data analysis; Databases; Fault diagnosis; High performance computing; Redundancy; Software quality; Software testing; Switches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering, 1992. Proceedings., Third International Symposium on
Conference_Location :
Research Triangle Park, NC
Print_ISBN :
0-8186-2975-4
Type :
conf
DOI :
10.1109/ISSRE.1992.285854
Filename :
285854
Link To Document :
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