Analysis of large system black-box test data

Author

Clapp, Kent C. ; Iyer, Ravishankar K. ; Levendel, Ytzhak

Author_Institution

AT&T Network Syst., Naperville, IL, USA

fYear

1992

fDate

7-10 Oct 1992

Firstpage

94

Lastpage

103

Abstract

Studies black box testing and verification of large systems. Testing data is collected from several test teams. A flat, integrated database of test, fault, repair, and source file information is built. A new analysis methodology based on the black box test design and white box analysis is proposed. The methodology is intended to support the reduction of testing costs and enhancement of software quality by improving test selection, eliminating test redundancy, and identifying error prone source files. Using example data from AT&T systems, the improved analysis methodology is demonstrated

Keywords

data analysis; large-scale systems; program testing; program verification; software quality; AT&T systems; error prone source files; fault information; integrated database; large system black-box test data; repair information; software quality; test minimization; test redundancy; test selection; testing costs; verification; white box analysis; Costs; Data analysis; Databases; Fault diagnosis; High performance computing; Redundancy; Software quality; Software testing; Switches; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Software Reliability Engineering, 1992. Proceedings., Third International Symposium on

Conference_Location

Research Triangle Park, NC

Print_ISBN

0-8186-2975-4

Type

conf

DOI

10.1109/ISSRE.1992.285854

Filename

285854