Title :
The nature of fault exposure ratio
Author :
Malaiya, Y.K. ; von Mayrhauser, A. ; Srimani, P.K.
Author_Institution :
Dept. of Comput. Sci., Colorado State Univ., Ft. Collins, CO, USA
Abstract :
The fault exposure ratio K is an important factor that controls the per-fault hazard rate, and hence the effectiveness of software testing. The paper examines the variations of K with fault density which declines with testing time. Because faults get harder to find, K should decline if testing is strictly random. However, it is shown that at lower fault densities K tends to increase, suggesting that real testing is more efficient than random testing. Data sets from several different projects are analyzed. Models for the two factors controlling K are suggested, which jointly lead to the logarithmic model
Keywords :
program testing; software reliability; fault density; fault exposure ratio; logarithmic model; per-fault hazard rate; software testing effectiveness; Computer science; Contracts; Fault detection; Hazards; Monitoring; Phase estimation; Phase measurement; Q measurement; Software reliability; System testing;
Conference_Titel :
Software Reliability Engineering, 1992. Proceedings., Third International Symposium on
Conference_Location :
Research Triangle Park, NC
Print_ISBN :
0-8186-2975-4
DOI :
10.1109/ISSRE.1992.285861