On reconstruction of heterogeneity parameters by refleted field in waveguided structures

Author

Aleksandrova, I.L. ; Baranov, S.V. ; Pleshchinskii, N.B.

Author_Institution

Inst. of Numerical Math. & Inf. Technol., Kazan Fed. Univ., Kazan, Russia

fYear

2012

fDate

28-30 Aug. 2012

Firstpage

52

Lastpage

55

Abstract

Heterogeneity in plane wave guide sets a connection between traces of potential functions of coming and of reflected waves on a section. It is possible to apply the scanning screen method to reconstruct kernel of the reflection operator in the case when possibilities of measuring equipment are limited. The influence of transversal screen in the wave guided structure on the reflection operator is investigated. It is proposed to use a solution of the auxiliary transmission problem for recalculation of data obtained by measuring characteristics of reflected field. It is shown on simple examples how information on heterogeneity in plane waveguide can be restored by the reflection matrix. The possibility of applying method of neural networks for solving the inverse problem is investigated.

Keywords

computational electromagnetics; diffraction gratings; electromagnetic wave diffraction; inverse problems; multilayer perceptrons; planar waveguides; auxiliary transmission problem; diffraction grating; electromagnetic wave diffraction; heterogeneity parameter reconstruction; inverse problem; multilayer perceptron model; neural networks; reflected field; reflection matrix; reflection operator; scanning screen method; waveguided structures; Diffraction; Electromagnetic scattering; Equations; Planar waveguides; Reflection; Transmission line matrix methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Mathematical Methods in Electromagnetic Theory (MMET), 2012 International Conference on

Conference_Location

Kyiv

ISSN

2161-1734

Print_ISBN

978-1-4673-4478-4

Type

conf

DOI

10.1109/MMET.2012.6331284

Filename

6331284