Current probe method applied in conductive electromagnetic compatibility (EMC)

Author

Zhao, Y. ; See, K.Y. ; Li, S.J. ; Jiang, N.Q. ; Wang, Q. ; Cao, Y. ; Wu, X.H.

Author_Institution

Coll. of Electr. Eng., Nanjing Normal Univ., Nanjing

Volume

3

fYear

2008

fDate

21-24 April 2008

Firstpage

1442

Lastpage

1445

Abstract

In this paper, the current probe measurement method applied in conductive EMC for determination of power-line EMI source impedance is presented. The theoretical analysis and experimental example are described in detail. Additionally, processing on how to measure the conductive EMI noise , i.e. common mode (CM) and differential mode (DM) noise is also introduced based on noise discrimination network. Results show that the current probe measurement method in paper is an effective tool for noise source analysis and noise suppression in conductive EMC engineering.

Keywords

electric impedance measurement; electric noise measurement; electromagnetic compatibility; electromagnetic interference; EMC; common mode noise; conductive electromagnetic compatibility; current probe measurement method; differential mode noise; noise discrimination network; power-line EMI source impedance; Circuit noise; Conductivity measurement; Current measurement; Delta modulation; Electromagnetic compatibility; Electromagnetic interference; Filters; Impedance measurement; Noise measurement; Probes; EMC; EMI filter design; current probe measurement; noise diagnosis network;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on

Conference_Location

Nanjing

Print_ISBN

978-1-4244-1879-4

Electronic_ISBN

978-1-4244-1880-0

Type

conf

DOI

10.1109/ICMMT.2008.4540716

Filename

4540716