Title :
Current probe method applied in conductive electromagnetic compatibility (EMC)
Author :
Zhao, Y. ; See, K.Y. ; Li, S.J. ; Jiang, N.Q. ; Wang, Q. ; Cao, Y. ; Wu, X.H.
Author_Institution :
Coll. of Electr. Eng., Nanjing Normal Univ., Nanjing
Abstract :
In this paper, the current probe measurement method applied in conductive EMC for determination of power-line EMI source impedance is presented. The theoretical analysis and experimental example are described in detail. Additionally, processing on how to measure the conductive EMI noise , i.e. common mode (CM) and differential mode (DM) noise is also introduced based on noise discrimination network. Results show that the current probe measurement method in paper is an effective tool for noise source analysis and noise suppression in conductive EMC engineering.
Keywords :
electric impedance measurement; electric noise measurement; electromagnetic compatibility; electromagnetic interference; EMC; common mode noise; conductive electromagnetic compatibility; current probe measurement method; differential mode noise; noise discrimination network; power-line EMI source impedance; Circuit noise; Conductivity measurement; Current measurement; Delta modulation; Electromagnetic compatibility; Electromagnetic interference; Filters; Impedance measurement; Noise measurement; Probes; EMC; EMI filter design; current probe measurement; noise diagnosis network;
Conference_Titel :
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-1879-4
Electronic_ISBN :
978-1-4244-1880-0
DOI :
10.1109/ICMMT.2008.4540716
