DocumentCode
181269
Title
Transient avalanche oscillation of IGBTs under high current
Author
Tao Hong ; Pfirsch, F. ; Reinhold, Brian ; Lutz, Josef ; Silber, Dieter
Author_Institution
Infineon Technol. AG, Germany
fYear
2014
fDate
15-19 June 2014
Firstpage
43
Lastpage
46
Abstract
Under high current, a new type of high frequency oscillation is found during the turn off of 3.3 kV IGBTs with trench gate structure. Measurements and simulations indicate that the avalanche generation and transit time effect of carriers within the IGBT leads to this oscillation. The transition time effect takes place during rise of collector voltage at turn-off, especially during the dynamic avalanche phase. The range of frequencies is at several 100 MHz. As the oscillation occurs only transiently, during dynamic avalanche, it is named - Transient Avalanche Oscillation (TA-Oscillation). Both the IMPATT- and PETT-mechanisms are found to be involved in the TA-Oscillation. Detailed investigations of the TA-Oscillation on a special development version of a 3.3 kV IGBT led to measures to suppress and avoid such an oscillation. A consequence of preventing this oscillation is proved as an improvement in robustness during turn-off.
Keywords
IMPATT diodes; insulated gate bipolar transistors; oscillations; semiconductor device models; IGBT; IMPATT mechanisms; PETT mechanisms; TA-oscillation; dynamic avalanche phase; high frequency oscillation; insulated gate bipolar transistors; transient avalanche oscillation; transition time effect; trench gate structure; voltage 3.3 kV; Insulated gate bipolar transistors; Oscillators; RLC circuits; Resonant frequency; Semiconductor device measurement; Semiconductor diodes; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location
Waikoloa, HI
ISSN
1943-653X
Print_ISBN
978-1-4799-2917-7
Type
conf
DOI
10.1109/ISPSD.2014.6855971
Filename
6855971
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