• DocumentCode
    181269
  • Title

    Transient avalanche oscillation of IGBTs under high current

  • Author

    Tao Hong ; Pfirsch, F. ; Reinhold, Brian ; Lutz, Josef ; Silber, Dieter

  • Author_Institution
    Infineon Technol. AG, Germany
  • fYear
    2014
  • fDate
    15-19 June 2014
  • Firstpage
    43
  • Lastpage
    46
  • Abstract
    Under high current, a new type of high frequency oscillation is found during the turn off of 3.3 kV IGBTs with trench gate structure. Measurements and simulations indicate that the avalanche generation and transit time effect of carriers within the IGBT leads to this oscillation. The transition time effect takes place during rise of collector voltage at turn-off, especially during the dynamic avalanche phase. The range of frequencies is at several 100 MHz. As the oscillation occurs only transiently, during dynamic avalanche, it is named - Transient Avalanche Oscillation (TA-Oscillation). Both the IMPATT- and PETT-mechanisms are found to be involved in the TA-Oscillation. Detailed investigations of the TA-Oscillation on a special development version of a 3.3 kV IGBT led to measures to suppress and avoid such an oscillation. A consequence of preventing this oscillation is proved as an improvement in robustness during turn-off.
  • Keywords
    IMPATT diodes; insulated gate bipolar transistors; oscillations; semiconductor device models; IGBT; IMPATT mechanisms; PETT mechanisms; TA-oscillation; dynamic avalanche phase; high frequency oscillation; insulated gate bipolar transistors; transient avalanche oscillation; transition time effect; trench gate structure; voltage 3.3 kV; Insulated gate bipolar transistors; Oscillators; RLC circuits; Resonant frequency; Semiconductor device measurement; Semiconductor diodes; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
  • Conference_Location
    Waikoloa, HI
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-2917-7
  • Type

    conf

  • DOI
    10.1109/ISPSD.2014.6855971
  • Filename
    6855971