Author :
Hannan, M.A. ; Hussin, Fawnizu Azmadi B.
Author_Institution :
Dept. of Electr., Electron. & Syst. Eng., Nat. Univ. of Malaysia, Bangi, Malaysia
Abstract :
These keynote discusses the following: Development of Intelligent Systems for Researchers, Engineers and Scientists; Reliability and Fault Tolerance of Electronic Circuits: A Test Perspective.
Keywords :
circuit reliability; fault tolerance; knowledge based systems; microprocessor chips; transistor circuits; electronic circuit fault tolerance; electronic circuit reliability; intelligent systems;
Conference_Titel :
Computer, Communications, and Control Technology (I4CT), 2015 International Conference on
Conference_Location :
Kuching
DOI :
10.1109/I4CT.2015.7219522
