Stochastic interconnect network fan-out distribution using Rent´s rule

Author

Zarkesh-Ha, Payman ; Davis, Jeffrey A. ; Loh, Wdham ; Meindl, James D.

Author_Institution

Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA

fYear

1998

fDate

1-3 Jun 1998

Firstpage

184

Lastpage

186

Abstract

Based on Rent´s rule, a well-established empirical relationship, a rigorous derivation of the fan-out distribution for random logic networks is performed. Then the maximum fan-out, total number of nets and the average fan-out are presented using the closed form equation of the fan-out distribution. Through comparison with actual product data, it is shown that the model successfully predicts the fan-out distribution of a random logic network

Keywords

integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; integrated logic circuits; network analysis; stochastic processes; Rent´s rule; average fan-out; closed form equation; fan-out distribution; fan-out distribution model; maximum fan-out; product data; random logic network; random logic networks; stochastic interconnect network fan-out distribution; Equations; Impedance; Large scale integration; Logic; Microelectronics; Optical interconnections; Predictive models; Propagation delay; Research and development; Stochastic processes;

fLanguage

English

Publisher

ieee

Conference_Titel

Interconnect Technology Conference, 1998. Proceedings of the IEEE 1998 International

Conference_Location

San Francisco, CA

Print_ISBN

0-7803-4285-2

Type

conf

DOI

10.1109/IITC.1998.704786

Filename

704786