• DocumentCode
    1813240
  • Title

    A transition criterion for the multigrid expectation maximization reconstruction algorithm for positron emission tomography

  • Author

    Doniere, Timothy F. ; Dhawan, Atam P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
  • fYear
    1994
  • fDate
    3-6 Nov 1994
  • Firstpage
    630
  • Abstract
    The multigrid expectation maximization algorithm (MGEM), an extension of the maximum likelihood (ML) algorithm, has been applied to the problem of reconstruction in positron emission tomography (PET). The MGEM algorithm implemented the expectation maximization (EM) algorithm at different image resolutions. The coarse grids were used to extract the low-frequency components and the finer grids to extract the high-frequency components. The convergence-rate of the MGEM algorithm was used to determine when to switch grid levels. A grid-level transition criterion which used the co-occurrence matrix statistics of the reconstructed image is presented. These statistics were computed on an image reconstructed from simulated PET data and provided a reliable transition criterion
  • Keywords
    image reconstruction; medical image processing; positron emission tomography; co-occurrence matrix statistics; coarse grids; finer grids; grid-level transition criterion; high-frequency components; image resolution; low-frequency components; maximum likelihood algorithm; medical diagnostic imaging; multigrid expectation maximization reconstruction algorithm; nuclear medicine; Computational modeling; Data mining; Histograms; Image converters; Image reconstruction; Image resolution; Maximum likelihood detection; Maximum likelihood estimation; Positron emission tomography; Reconstruction algorithms; Statistical distributions; Statistics; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1994. Engineering Advances: New Opportunities for Biomedical Engineers. Proceedings of the 16th Annual International Conference of the IEEE
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-2050-6
  • Type

    conf

  • DOI
    10.1109/IEMBS.1994.411836
  • Filename
    411836