DocumentCode
181326
Title
Forward-voltage-tunable schottky-integrated trench MOSFETs
Author
Chuang, Chiao-Shun Patrick ; Chen, Kai-Yu Gary ; Hung, Yu-Ren Ryan ; Ta-Chuan Kuo ; Huang, Cheng-Chin Tony
Author_Institution
MOSFET BU, DIODES Inc., New Taipei, Taiwan
fYear
2014
fDate
15-19 June 2014
Firstpage
159
Lastpage
162
Abstract
We presented the 4-photo-mask schottky-integrated trench MOSFETs. Traditionally monolithic schottky-integrated MOSFETs are composed of two regions: one is MOSFET cells, the other is schottky cells. However, it needs additional mask and processes for schottky structures. 30V schottky-integrated trench MOSFETs by self-aligned schottky into every MOS cell was successfully fabricated in this paper. Trench mask was utilized for body implant and trench etching. Forward voltage (VF) is tunable by tilt angle implant after contact etching. Furthermore, UIS (unclamped Inductive Switching) ability was also improved comparing to conventional trench MOSFETs. Finally, relationship between VF, Idss (drain leakage current), and Qrr (reverse recovery charge) could be optimized for improving the efficiency for DC-DC converters.
Keywords
MOSFET; etching; masks; 4-photomask Schottky-integrated trench MOSFETs; DC-DC converters; MOSFET cells; Schottky cells; Schottky structures; UIS; contact etching; drain leakage current; forward-voltage-tunable Schottky-integrated trench MOSFETs; monolithic Schottky-integrated MOSFETs; reverse recovery charge; tilt angle implant etching; trench etching; trench mask; unclamped inductive switching ability; voltage 30 V; Etching; Implants; Junctions; MOSFET; Metals; Schottky barriers; Schottky diodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location
Waikoloa, HI
ISSN
1943-653X
Print_ISBN
978-1-4799-2917-7
Type
conf
DOI
10.1109/ISPSD.2014.6856000
Filename
6856000
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