DocumentCode
1813344
Title
The optical constants of thin films calculated from reflectance and transmittance measurements
Author
Chiang, Donyau ; Chu, Cheng Hung ; Chiang, Hai-Pang ; Tsai, Din Ping
Author_Institution
Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu
fYear
2009
fDate
10-13 May 2009
Firstpage
101
Lastpage
103
Abstract
The refraction index n and extinguished coefficient k of materials can be calculated from their reflection and transmittance measurements with varied wavelengths. The organic and inorganic materials used for optical recording medium materials are examined. The organic dyes show that significant optical constants vary with the laser wavelength, in comparison to the inorganic phase-change materials.
Keywords
dyes; optical films; optical materials; optical storage; optical variables measurement; phase change materials; refractive index; thin films; inorganic phase-change material; laser wavelength; optical recording medium material; organic dyes; organic material; reflectance measurement; thin film optical constant; transmittance measurement; Geometrical optics; Inorganic materials; Magnetic materials; Optical films; Optical materials; Optical recording; Optical refraction; Organic materials; Reflectivity; Sea measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Data Storage Topical Meeting, 2009. ODS '09.
Conference_Location
Lake Buena Vista, FL
Print_ISBN
978-1-4244-3342-1
Electronic_ISBN
978-1-4244-3343-8
Type
conf
DOI
10.1109/ODS.2009.5031741
Filename
5031741
Link To Document