DocumentCode :
1813344
Title :
The optical constants of thin films calculated from reflectance and transmittance measurements
Author :
Chiang, Donyau ; Chu, Cheng Hung ; Chiang, Hai-Pang ; Tsai, Din Ping
Author_Institution :
Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Hsinchu
fYear :
2009
fDate :
10-13 May 2009
Firstpage :
101
Lastpage :
103
Abstract :
The refraction index n and extinguished coefficient k of materials can be calculated from their reflection and transmittance measurements with varied wavelengths. The organic and inorganic materials used for optical recording medium materials are examined. The organic dyes show that significant optical constants vary with the laser wavelength, in comparison to the inorganic phase-change materials.
Keywords :
dyes; optical films; optical materials; optical storage; optical variables measurement; phase change materials; refractive index; thin films; inorganic phase-change material; laser wavelength; optical recording medium material; organic dyes; organic material; reflectance measurement; thin film optical constant; transmittance measurement; Geometrical optics; Inorganic materials; Magnetic materials; Optical films; Optical materials; Optical recording; Optical refraction; Organic materials; Reflectivity; Sea measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Data Storage Topical Meeting, 2009. ODS '09.
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-3342-1
Electronic_ISBN :
978-1-4244-3343-8
Type :
conf
DOI :
10.1109/ODS.2009.5031741
Filename :
5031741
Link To Document :
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