DocumentCode :
1813446
Title :
Estimation of readout signal fluctuation in multi-layer index modulation
Author :
Saito, Kimihiro
Author_Institution :
Adv. Storage Lab., Sony Corp., Atsugi
fYear :
2009
fDate :
10-13 May 2009
Firstpage :
113
Lastpage :
114
Abstract :
In micro-reflector optical disc systems, multi-layer index modulation distribution causes wavefront fluctuation in the light beam passing through the recorded layers. Generally, the Marechal´s criterion 0.07lambdarms is widely used as a figure of merit for wavefront quality of a light beam for readout. However, due to the fine structure of the wavefront fluctuation by the recorded marks, the decay of readout signal is less comparing to the general case.
Keywords :
micro-optics; optical disc storage; optical modulation; optical multilayers; reflectivity; Marechal criterion; micro-reflector optical disc system; multilayer index modulation; readout signal fluctuation estimation; wavefront fluctuation; Diffraction; Fluctuations; Glass; Jitter; Laboratories; Material storage; Optical materials; Optical modulation; Optical recording; Servomechanisms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Data Storage Topical Meeting, 2009. ODS '09.
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-3342-1
Electronic_ISBN :
978-1-4244-3343-8
Type :
conf
DOI :
10.1109/ODS.2009.5031745
Filename :
5031745
Link To Document :
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