Title :
Optimization design of ground plane PBG structure of T-shape microstrip line by improved FGA
Author :
Xiao, Fang ; Yan, Dong ; Sun, Li
Author_Institution :
Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin
Abstract :
A new fuzzy genetic algorithm (FGA) is developed to reduce crosstalk of T-shape microstrip lines in high speed circuit systems, which is used to optimize the ground plane with photonic bandgap (PBG) structure. The genetic operators (crossover and mutation) are adjusted self-adaptively by fuzzy controller and good convergent character and global optimization are improved. Based on the PML-FDTD method, the fitness value is established by taking the sum of weighted performance index function of crosstalk and return loss, through which is optimized the crosstalk between T-shape microstrip line and adjacent line in the ground plane. Comparing the simulation results of the fitness function using different parameters, numerical results demonstrate that the crosstalk is decreased 8 dB which is caused by T-shape microstrip line and adjacent line above the photonic- bandgap ground. Then the return loss and the signal distortion reduce effectively.
Keywords :
crosstalk; finite difference time-domain analysis; fuzzy set theory; genetic algorithms; microstrip lines; photonic band gap; PML-FDTD; T-shape microstrip lines; crosstalk; fuzzy controller; fuzzy genetic algorithm; genetic operators; global optimization; ground plane PBG structure; high speed circuit systems; index function; optimization design; photonic bandgap; return loss; Circuits; Crosstalk; Design optimization; Fuzzy control; Fuzzy systems; Genetic algorithms; Genetic mutations; Microstrip; Optical losses; Photonic band gap; Finite-difference time-domain(FDTD) method; crosstalk; fuzzy genetic algorithm(FGA); photonic-bandgap(PBG);
Conference_Titel :
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-1879-4
Electronic_ISBN :
978-1-4244-1880-0
DOI :
10.1109/ICMMT.2008.4540749