DocumentCode :
1813592
Title :
In-situ Raman scattering spectroscopy for super resolution optical disk
Author :
Kuwahara, Masashi ; Shima, Takayuki ; Tominaga, Junji
Author_Institution :
Center for Appl. Near-Field Opt. Res., Nat. Inst. of Adv., Tsukuba
fYear :
2009
fDate :
10-13 May 2009
Firstpage :
52
Lastpage :
54
Abstract :
We have developed a combined Raman scattering spectroscopy and disk property measurement system to evaluate crystallinity of SRR functional layer inside the rotaed optical disk. The CNR and Raman scattering spectrum can be measured simultaneously from Sb functional layer. Stokes and anti-stokes peak intensities of the spectrum were dependent and independent on the laser power. We have discussed that it is closely related to the SRR phenomenoin.
Keywords :
Raman spectra; laser beams; optical disc storage; optical materials; Raman scattering spectroscopy; Stokes intensity; disk property measurement system; laser power; optical disk; optical readout crystallinity; Crystallization; Disk drives; Laser modes; Optical fibers; Optical filters; Optical scattering; Power lasers; Raman scattering; Spectroscopy; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Data Storage Topical Meeting, 2009. ODS '09.
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-3342-1
Electronic_ISBN :
978-1-4244-3343-8
Type :
conf
DOI :
10.1109/ODS.2009.5031751
Filename :
5031751
Link To Document :
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