Title :
Introducing redundancy in field programmable gate arrays
Author :
Hatori, F. ; Sakurai, T. ; Nogami, K. ; Sawada, K. ; Takahashi, M. ; Ichida, M. ; Uchida, M. ; Yoshii, I. ; Kawahara, Y. ; Hibi, T. ; Saeki, Y. ; Muroga, H. ; Tanaka, A. ; Kanzaki, K.
Author_Institution :
Toshiba Corp., Kawasaki, Japan
Abstract :
A redundancy scheme and circuitry for field programmable gate arrays (FPGAs) are proposed. The scheme requires the modification of the wiring resource segmentation and the addition of spare rows and selector circuits. An improved yield gross product is quantitatively studied. The disadvantages caused by this architecture, such as an area overhead and speed degradation, are discussed. It is concluded that, in this redundancy scheme, the sufficient number of spare rows is one or two for practical cases and the gross yield product can be doubled at an early stage of production. The proposed scheme can be applicable to a wide range of FPGA architectures
Keywords :
field programmable gate arrays; ASIC; area overhead; field programmable gate arrays; improved yield gross product; redundancy scheme; selector circuits; spare rows; speed degradation; Application specific integrated circuits; Costs; Decoding; Field programmable gate arrays; Laboratories; Microelectronics; Production; Random access memory; Semiconductor devices; Wiring;
Conference_Titel :
Custom Integrated Circuits Conference, 1993., Proceedings of the IEEE 1993
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0826-3
DOI :
10.1109/CICC.1993.590575