Title :
Experimental study of 650V AlGaN/GaN HEMT short-circuit safe operating area (SCSOA)
Author :
Xing Huang ; Dong Young Lee ; Bondarenko, V. ; Baker, Anthony ; Sheridan, David C. ; Huang, Alex Q. ; Baliga, B. Jayant
Author_Institution :
FREEDM Syst. Center, North Carolina State Univ., Raleigh, NC, USA
Abstract :
The short-circuit reliability of power switches plays very important part in many applications, where a 10μs short-circuit duration at 400V is usually required for 650V switches. Although emerging high voltage AlGaN/GaN HEMT technologies have shown switching advantages, the short-circuit performance has not been thoroughly investigated. In this work, we present an experimental study and numerical simulation analysis of 650V AlGaN/GaN HEMTs short-circuit safe-operating-area (SCSOA), and provide a theory for the reduction in ruggedness at high voltage short circuit conditions.
Keywords :
III-V semiconductors; aluminium compounds; field effect transistor switches; gallium compounds; numerical analysis; power semiconductor switches; semiconductor device reliability; short-circuit currents; wide band gap semiconductors; AlGaN; HEMT short-circuit safe operating area; SCSOA; high voltage HEMT technology; high voltage short circuit conditions; numerical simulation analysis; power switches; short-circuit reliability; time 10 mus; voltage 400 V; voltage 650 V; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; Reliability; Silicon carbide; Temperature measurement;
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
Print_ISBN :
978-1-4799-2917-7
DOI :
10.1109/ISPSD.2014.6856029