• DocumentCode
    181385
  • Title

    Experimental study of 650V AlGaN/GaN HEMT short-circuit safe operating area (SCSOA)

  • Author

    Xing Huang ; Dong Young Lee ; Bondarenko, V. ; Baker, Anthony ; Sheridan, David C. ; Huang, Alex Q. ; Baliga, B. Jayant

  • Author_Institution
    FREEDM Syst. Center, North Carolina State Univ., Raleigh, NC, USA
  • fYear
    2014
  • fDate
    15-19 June 2014
  • Firstpage
    273
  • Lastpage
    276
  • Abstract
    The short-circuit reliability of power switches plays very important part in many applications, where a 10μs short-circuit duration at 400V is usually required for 650V switches. Although emerging high voltage AlGaN/GaN HEMT technologies have shown switching advantages, the short-circuit performance has not been thoroughly investigated. In this work, we present an experimental study and numerical simulation analysis of 650V AlGaN/GaN HEMTs short-circuit safe-operating-area (SCSOA), and provide a theory for the reduction in ruggedness at high voltage short circuit conditions.
  • Keywords
    III-V semiconductors; aluminium compounds; field effect transistor switches; gallium compounds; numerical analysis; power semiconductor switches; semiconductor device reliability; short-circuit currents; wide band gap semiconductors; AlGaN; HEMT short-circuit safe operating area; SCSOA; high voltage HEMT technology; high voltage short circuit conditions; numerical simulation analysis; power switches; short-circuit reliability; time 10 mus; voltage 400 V; voltage 650 V; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; Reliability; Silicon carbide; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
  • Conference_Location
    Waikoloa, HI
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-2917-7
  • Type

    conf

  • DOI
    10.1109/ISPSD.2014.6856029
  • Filename
    6856029