DocumentCode :
1813993
Title :
Bayesian models and stochastic processes applied to CSP sampling plans for quality control in production in series and by lots
Author :
Correa, Rodrigo Barbosa ; Paternina-Arboleda, Carlos D. ; Ríos, Diana G Ramírez
Author_Institution :
Dept. of Ind. Eng., Univ. del Norte, Barranquilla, Colombia
fYear :
2009
fDate :
13-16 Dec. 2009
Firstpage :
2995
Lastpage :
2999
Abstract :
Nowadays, businesses consider that their methods are perfect, this means, that by having available a department of analysis and statistic control of the process, everything that the inspector or the inspection tools decides are considered to be correct, with not even a minimum of error involved. Yet, if they considered the principles of uncertainty of Heisenberg, in which he believes that the uncertainty associated to the observation, does not contradict the existence of laws that govern the behavior of the particles in the universe, not even the capacity of the scientists to discover those laws, which will be seen as precise predictions, which can be substituted by the calculations of probabilities. This investigation focuses on the study of CSP sampling plans for acceptance with Bayesian and Markovian revisions, in the processes of production in series and by lots, that support the quality activities and reduction of costs by inspection.
Keywords :
Bayes methods; Markov processes; cost reduction; lot sizing; probability; quality control; sampling methods; statistical process control; Bayesian model; CSP sampling plan; Heisenberg uncertainty; Markovian revision; cost reduction; lots production; probability; process statistic control; production in series; quality control; stochastic process; Bayesian methods; Error analysis; Inspection; Process control; Production; Quality control; Sampling methods; Statistical analysis; Stochastic processes; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2009 Winter
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-5770-0
Type :
conf
DOI :
10.1109/WSC.2009.5429224
Filename :
5429224
Link To Document :
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