Title :
On the Frequency Limits of SiGe HBTs for TeraHertz Applications
Author :
Yuan, Jiahui ; Krithivasan, Ram ; Cressler, John D. ; Khater, Marwan H. ; Ahlgren, David C. ; Joseph, Alvin J.
Author_Institution :
Georgia Inst. of Technol., Atlanta
fDate :
Sept. 30 2007-Oct. 2 2007
Abstract :
We report record fmax for a silicon-based transistor, and the first combined set of f1+ fmax above one-terahertz for silicon-germanium heterojunction bipolar transistors (SiGe HBTs). Peak fmax of 618 GHz and frfloor of 463 GHz at 4.5 K (chuck temperature) were measured for a scaled 0.12 times 2.5 mum-SiGe HBT (343 / 309 GHz at 300 K), at a breakdown voltage BVCEO of 1.62 V (1.70 at 300 K), yielding a record fT x BVCEO product of 750 GHz-V (510 GHz-V at 300 K). An examination of base transport in these devices at low temperatures suggests non-equilibrium effects are operative.
Keywords :
Ge-Si alloys; heterojunction bipolar transistors; semiconductor materials; submillimetre wave transistors; HBT; SiGe; base transport examination; breakdown voltage; chuck temperature; frequency 309 GHz; frequency 343 GHz; frequency 463 GHz; frequency 750 GHz; frequency limits; silicon-germanium heterojunction bipolar transistors; temperature 300 K; temperature 4.5 K; terahertz applications; voltage 1.62 V; Frequency; Germanium silicon alloys; HEMTs; Heterojunction bipolar transistors; III-V semiconductor materials; Indium phosphide; MODFETs; Silicon germanium; Temperature; USA Councils;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2007. BCTM '07. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-1019-4
Electronic_ISBN :
1088-9299
DOI :
10.1109/BIPOL.2007.4351830