Title :
Meeting challenges of generic pervasive diagnostics
Author_Institution :
Adv. Technol. & Stand, Siemens AG, Nuremberg, Germany
Abstract :
With the ongoing growth in the complexity of plants and automation systems, effective computer-based diagnostics is a key element for efficient plant operation. From an IT perspective, modern industrial plants may be seen as pervasive computing environments with heterogeneous interconnected nodes. Using these nodes for distributed diagnostics promises effective handling of diagnostic problems in complex environments. This paper introduces the Fully Integrated Diagnostics (FID) approach. Built around a generic diagnostic knowledge representation language (DKRL), FID is intended to homogeneously connect all instances related to diagnostics, and to provide an architectural concept for the generic management and use of diagnostic knowledge in a distributed fashion. This will be referred to as “generic pervasive diagnostics”.
Keywords :
industrial plants; knowledge representation languages; maintenance engineering; production engineering computing; ubiquitous computing; DKRL; FID; automation systems; computer-based diagnostics; distributed diagnostics; fully integrated diagnostics; generic diagnostic knowledge representation language; generic pervasive diagnostics; heterogeneous interconnected nodes; industrial plants; pervasive computing environments; plant complexity; plant operation;
Conference_Titel :
Emerging Technologies & Factory Automation (ETFA), 2012 IEEE 17th Conference on
Conference_Location :
Krakow
Print_ISBN :
978-1-4673-4735-8
Electronic_ISBN :
1946-0740
DOI :
10.1109/ETFA.2012.6489686