DocumentCode :
1814491
Title :
Pulse discrimination between recoil protons and secondary electrons for a silicon diode based neutron spectrometer
Author :
Fazzi, Alberto ; Agosteo, Stefano ; Pola, Andrea ; Varoli, Vincenzo ; Zotto, Pierluigi
Author_Institution :
Nucl. Eng. Dept., Politecnico di Milano, Italy
Volume :
2
fYear :
2003
fDate :
19-25 Oct. 2003
Firstpage :
767
Abstract :
The feasibility of the discrimination between protons and secondary electrons was investigated in order to decrease the lower limit of a recoil-proton spectrometer for neutrons based on a silicon P-i-N diode. The simulation of the ionization generated in the detector by protons and electrons and the simulation of the relevant induced currents show that such discrimination is feasible provided that the "rear side injection" configuration and a low noise set-up are adopted. The difference between the collecting times of the two pulses is maximized and used for the rising time based discrimination. The neutron spectrometer consists of a 3 mm2 area, 300 μm thick silicon P-i-N diode covered with a polyethylene foil on the n-side. The ENC is 720 rms electrons at 20 ns shaping time. Experimental results on monoenergetic neutrons show the effectiveness of this discrimination in decreasing the lower limit of the recoil proton energy spectrum from 1.5 to 0.9 MeV.
Keywords :
electron detection; neutron spectrometers; proton detection; secondary electron emission; silicon radiation detectors; 1.5 to 0.9 MeV; 20 ns; 300 micron; Si diode based neutron spectrometer; low noise set-up; pulse discrimination; rear side injection; recoil protons; recoil-proton spectrometer; secondary electrons; silicon P-i-N diode; Detectors; Electrons; Ionization; Neutrons; Noise generators; P-i-n diodes; Polyethylene; Protons; Silicon; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8257-9
Type :
conf
DOI :
10.1109/NSSMIC.2003.1351811
Filename :
1351811
Link To Document :
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